Techniques for generating 3-D EBSD microstructures by FIB tomography

Materials Characterization

Volumn 58, Issue 10, 2007, Pages 961-967

  Xu, W ^a   Ferry, M ^a   Mateescu, N ^a   Cairney, J M ^b   Humphreys, F J ^c  

^a UNIVERSITY OF NEW SOUTH WALES   (Australia)

^b UNIVERSITY OF SYDNEY   (Australia)

^c UNIVERSITY OF MANCHESTER   (United Kingdom)

Author keywords

EBSD; FIB tomography; Focused ion beam (FIB); Recrystallization; Serial sectioning

Indexed keywords

CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; FOCUSED ION BEAMS; RECRYSTALLIZATION (METALLURGY); TOMOGRAPHY;

ELECTRON BACKSCATTER DIFFRACTION (EBSD); FIB TOMOGRAPHY; RECRYSTALLIZED METALS; SERIAL SECTIONING;

MICROSTRUCTURE;

EID: 34548185498     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.matchar.2006.10.001     Document Type: Article

References (11)

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