Combining FIB milling and conventional Argon ion milling techniques to prepare high-quality site-specific TEM samples for quantitative EELS analysis of oxygen in molten iron

Journal of Microscopy

Volumn 238, Issue 3, 2010, Pages 200-209

  Miyajima, N ^a   Holzapfel, C ^b,e   Asahara, Y ^a,f   Dubrovinsky, L ^c   Frost, D J ^a   Rubie, D C ^a   Drechsler, M ^g   Niwa, K ^d,g   Ichihara, M ^d   Yagi, T ^d  

^a UNIVERSITÄT BAYREUTH   (Germany)

^b SAARLAND UNIVERSITY   (Germany)

^c UNIVERSITY OF BAYREUTH   (Germany)

^d UNIVERSITY OF TOKYO   (Japan)

^e Schleifring und Apparatebau GmbH   (Germany)

^f OSAKA UNIVERSITY   (Japan)

^g NAGOYA UNIVERSITY   (Japan)

Author keywords

Argon ion milling; Electron energy loss spectroscopy; Focused ion beam milling; High pressure and high temperature; Laser heated diamond anvil cell; Molten iron; Oxygen K edge ELNES; TEM; TEM sample preparation

Indexed keywords

DISSOCIATION; DISSOLVED OXYGEN; ELECTRON EMISSION; ELECTRON SCATTERING; ELECTRONIC STRUCTURE; ELECTRONS; ENERGY DISSIPATION; FOCUSED ION BEAMS; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; IONS; IRON; IRON COMPOUNDS; MILLING (MACHINING); MOLECULAR BIOLOGY; NANOCRYSTALS; QUALITY CONTROL; SPECTRUM ANALYSIS;

ARGON ION MILLING; ELECTRON ENERGY-LOSS SPECTROSCOPIES; FOCUSED ION BEAM MILLING; HIGH PRESSURE AND HIGH TEMPERATURE; LASER-HEATED DIAMOND-ANVIL CELL; MOLTEN IRON; OXYGEN K-EDGE; OXYGEN K-EDGE ELNES; TEM; TEM SAMPLE PREPARATION;

ELECTRON ENERGY LOSS SPECTROSCOPY;

ARGON; IRON; OXYGEN;

ACCURACY; ARTICLE; CHEMICAL STRUCTURE; CONTROLLED STUDY; ELECTRON BEAM; ELECTRON ENERGY LOSS SPECTROSCOPY; HIGH TEMPERATURE; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; SIGNAL NOISE RATIO; STRUCTURE ANALYSIS; THICKNESS; TRANSMISSION ELECTRON MICROSCOPY;

EID: 77952610340     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2009.03341.x     Document Type: Article

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