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Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 42, Issue 11, 2011, Pages 3323-3332

X-ray diffraction analysis of residual stress in thin polycrystalline anatase films and elastic anisotropy of anatase

(3) Matej Z a Kuzel R a Nichtova L a

a CHARLES UNIVERSITY (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

AB INITIO CALCULATIONS; AMORPHOUS STATE; ANATASE FILMS; CRYSTALLIZATION PROCESS; DATA SUPPORT; ELASTIC ANISOTROPY; EXPERIMENTAL EVIDENCE; PATTERN FITTING; PHOTOINDUCED HYDROPHILICITY; POLYCRYSTALLINE; RUTILE PHASE; SIMPLIFIED METHOD; TETRAGONAL SYMMETRIES; TITANIUM DIOXIDE FILMS; XRD;

AMORPHOUS FILMS; AMORPHOUS MATERIALS; ANISOTROPY; CRYSTALLIZATION; ELASTIC CONSTANTS; OXIDE MINERALS; RESIDUAL STRESSES; STRESS ANALYSIS; TENSILE STRESS; TITANIUM; X RAY DIFFRACTION ANALYSIS;

TITANIUM DIOXIDE;

EID: 80053570153 PISSN: 10735623 EISSN: None Source Type: Journal
DOI: 10.1007/s11661-010-0468-z Document Type: Conference Paper

Times cited : (13)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.