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Volumn 33, Issue 1, 2000, Pages 103-107
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Diffraction-line shift caused by residual stress in polycrystal for all Laue groups in classical approximations
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Author keywords
[No Author keywords available]
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Indexed keywords
ARTICLE;
CRYSTAL STRUCTURE;
INTERMETHOD COMPARISON;
MATHEMATICAL ANALYSIS;
MEASUREMENT;
NEUTRON;
STRESS;
X RAY DIFFRACTION;
ACRONICTA LEPORINA;
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EID: 0034477413
PISSN: 00218898
EISSN: None
Source Type: Journal
DOI: 10.1107/S002188989901345X Document Type: Article |
Times cited : (21)
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References (10)
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