Reciprocal-space mapping for simultaneous determination of texture and stress in thin films

Journal of Applied Crystallography

Volumn 39, Issue 4, 2006, Pages 487-501

  Šimek, Daniel ^a   Kužel, Radomír ^b   Rafaja, David ^c  

^a INSTITUTE OF PHYSICS   (Czech Republic)

^b CHARLES UNIVERSITY   (Czech Republic)

^c TU BERGAKADEMIE FREIBERG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 33746395146     PISSN: 00218898     EISSN: 16005767     Source Type: Journal    
DOI: 10.1107/S0021889806015500     Document Type: Article

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