The intrinsic resolution limit in the atomic force microscope: Implications for heights of nano-scale features

PLoS ONE

Volumn 6, Issue 8, 2011, Pages

  Santos, Sergio ^a   Barcons, Victor ^b   Christenson, Hugo K ^a   Font, Josep ^b   Thomson, Neil H ^a  

^a UNIVERSITY OF LEEDS   (United Kingdom)

^b UNIVERSITAT POLITÈCNICA DE CATALUNYA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ARTICLE; ATOMIC FORCE MICROSCOPY; HEIGHT; NANOIMAGING; NANOTECHNOLOGY; RELIABILITY; TOPOGRAPHY; CHEMISTRY; METHODOLOGY;

DNA; IMMUNOGLOBULIN G; NANOMATERIAL;

DNA; IMMUNOGLOBULIN G; MICROSCOPY, ATOMIC FORCE; NANOSTRUCTURES;

EID: 80052281276     PISSN: None     EISSN: 19326203     Source Type: Journal    
DOI: 10.1371/journal.pone.0023821     Document Type: Article

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