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Volumn 21, Issue 6, 2010, Pages
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Soft-contact imaging in liquid with frequency-modulation torsion resonance mode atomic force microscopy
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Author keywords
[No Author keywords available]
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Indexed keywords
AFM CANTILEVERS;
BIOLOGICAL PROCESS;
CONTACT IMAGING;
HIGH QUALITY FACTORS;
HIGH RESOLUTION;
HIGH-RESOLUTION IMAGING;
HIGH-SENSITIVITY;
HIGH-SPEED AFM;
LATERAL FORCE;
MICA SURFACES;
RESONANCE FREQUENCY SHIFT;
RESONANCE MODE;
RESONANT FREQUENCIES;
SAMPLE SURFACE;
SOFT CONTACTS;
TORSIONAL OSCILLATION;
TORSIONAL RESONANCES;
ATOMS;
LIQUIDS;
MICA;
NATURAL FREQUENCIES;
SILICATE MINERALS;
ATOMIC FORCE MICROSCOPY;
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EID: 73949139931
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/21/6/065710 Document Type: Article |
Times cited : (22)
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References (32)
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