Convergent-beam electron diffraction

Journal of Electron Microscopy

Volumn 60, Issue SUPPL. 1, 2011, Pages

  Tanaka, Michiyoshi ^a   Tsuda, Kenji ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

CBED; lattice defects; point groups; space groups; strain analysis; structure analysis

Indexed keywords

CRYSTAL SYMMETRY;

CONVERGENT BEAMS; CONVERGENT-BEAM ELECTRON DIFFRACTION; DETERMINATION METHODS; DIFFRACTION TECHNIQUES; LARGE ANGLE CONVERGENT BEAM ELECTRON DIFFRACTIONS; LATTICE STRAIN ANALYSIS; NANO-METER-SCALE; SPACE GROUPS; STRAIN ANALYSIS; STRUCTURE ANALYSIS;

ELECTRON DIFFRACTION;

EID: 80052062933     PISSN: 00220744     EISSN: 14779986     Source Type: Journal    
DOI: 10.1093/jmicro/dfr038     Document Type: Article

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