Determination of the electrostatic potential and electron density of silicon using convergent-beam electron diffraction

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 64, Issue 5, 2008, Pages 587-597

  Ogata, Yoichiro ^a   Tsuda, Kenji ^a   Tanaka, Michiyoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Convergent beam electron diffraction (CBED); Electron density; Electrostatic potential; Silicon

Indexed keywords

EID: 49749088002     PISSN: 01087673     EISSN: 16005724     Source Type: Journal    
DOI: 10.1107/S0108767308021338     Document Type: Article

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