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Volumn 62, Issue 12, 2001, Pages 2109-2117

Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data

Author keywords

X ray diffraction

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON BEAMS; HIGH ENERGY ELECTRON DIFFRACTION; RELIABILITY; SYNCHROTRON RADIATION; X RAY DIFFRACTION;

EID: 0035743916     PISSN: 00223697     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-3697(01)00167-6     Document Type: Conference Paper
Times cited : (24)

References (20)
  • 6
    • 0001334331 scopus 로고
    • On the accurate measurement of structure-factor amplitudes and phases by electron diffraction
    • (1993) Acta Cryst. A , vol.49 , pp. 231-260
    • Spence, J.C.H.1
  • 8
    • 0009685719 scopus 로고
    • Automated structure-factor refinement from convergent beam electron diffraction patterns
    • (1993) Acta Cryst. A , vol.49 , pp. 429-435
    • Zuo, J.M.1
  • 15
    • 0000914758 scopus 로고
    • Extinction within the limit of validity of the Darwin transfer equations - I: General formalisms for primary and secondary extinction and their application to spherical crystals
    • (1974) Acta Cryst. A , vol.30 , pp. 129-147
    • Becker, P.J.1    Coppens, P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.