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Volumn 62, Issue 12, 2001, Pages 2109-2117
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Charge density analysis from complementary high energy synchrotron X-ray and electron diffraction data
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Author keywords
X ray diffraction
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Indexed keywords
ELECTRIC POTENTIAL;
ELECTRON BEAMS;
HIGH ENERGY ELECTRON DIFFRACTION;
RELIABILITY;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION;
BLOCH-WAVE METHOD;
CHARGE DENSITY;
CARRIER CONCENTRATION;
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EID: 0035743916
PISSN: 00223697
EISSN: None
Source Type: Journal
DOI: 10.1016/S0022-3697(01)00167-6 Document Type: Conference Paper |
Times cited : (24)
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References (20)
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