Accurate structure refinement and measurement of crystal charge distribution using convergent beam electron diffraction

Microscopy Research and Technique

Volumn 46, Issue 3, 1999, Pages 220-233

  Zuo, J M ^a  

^a ARIZONA STATE UNIVERSITY   (United States)

Author keywords

2 D detectors; Energy filtering; Imaging filter; Structure factor

Indexed keywords

BANDPASS FILTERS; ELECTRON DIFFRACTION; MAGNESIA;

2-D DETECTOR; CONVERGENT BEAMS; ELECTRON DIFFRACTION PATTERN; ENERGY; ENERGY FILTERING; IMAGING FILTERS; MEASUREMENTS OF; STRUCTURE FACTORS; STRUCTURE MEASUREMENT; STRUCTURE REFINEMENTS;

CRYSTAL STRUCTURE;

MAGNESIUM OXIDE;

ARTICLE; CHEMICAL BOND; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; FILTER; IMAGE DISPLAY; IMAGE ENHANCEMENT; PRIORITY JOURNAL; STATISTICAL MODEL; STRUCTURE ANALYSIS;

EID: 0033179145     PISSN: 1059910X     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1097-0029(19990801)46:3<220::AID-JEMT5>3.0.CO;2-1     Document Type: Article

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