Quantitative zone-axis convergent-beam electron diffraction (CBED) studies of metals. I. Structure-factor measurements

Acta Crystallographica Section A: Foundations of Crystallography

Volumn 55, Issue 3, 1999, Pages 471-479

  Saunders, M ^a,c   Fox, A G ^a   Midgley, P A ^b  

^a Naval Postgraduate School ^*  (United States)

^b UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^c UPPSALA UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0001143695     PISSN: 01087673     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0108767398012604     Document Type: Article

References (28)

1. Anstis, G. R. (1996). Acta Cryst. A52, 450-455.
2. Bagayoko, D., Laurent, D. G., Singhal, S. P. & Callaway, J. (1980). Phys. Lett. A, 76, 187-190.
3. Bird, D. M. & King, Q. A. (1990). Acta Cryst. A46, 202-208.
4. Bird, D. M. & Saunders, M. (1992). Ultramicroscopy, 45, 241-251.
5. Blaha, P., Schwarz, K., Dufek, K. & Augustyn, R. (1995). WIEN95. Technical University of Vienna 1995. [Improved and updated Unix version of the original copyrighted XIEN code published by P. Blaha, K. Schwarz, P. Sorantin, & S. B. Trickey (1990). Comput. Phys. Commun. 59, 399.]
6. Blaha, P., Schwarz, K., Dufek, K. & Augustyn, R. (1995). WIEN95. Technical University of Vienna 1995. [Improved and updated Unix version of the original copyrighted XIEN code published by P. Blaha, K. Schwarz, P. Sorantin, & S. B. Trickey (1990). Comput. Phys. Commun. 59, 399.]
7. Diana, M., Mazzone, G. & DeMarco, J. J. (1969). Phys. Rev. 87, 973-978.
8. Doyle, P. A. & Turner, P. S. (1968). Acta Cryst. A24, 390-397.
9. Fox, A. G. & Fisher, R. M. (1988). Aust. J. Phys. 41, 461-468.
10. Holmestad, R., Mornirolli, J.-R, Zuo, J. M. & Spence, J. M. (1997). Microsc. Microanal. 3 (Suppl. 2), 1051-1052.
11. Holmestad, R., Zuo, J. M., Spence, J. C. H., Hoier, R. & Horita, Z. (1995). Philos. Mag. A72, 579-601.
12. Humphreys, C. J. (1975). Rep. Prog. Phys. 42, 1825-1887.
13. Kossel, W. & MÎllenstedt, G. (1938). Ann. Phys. (Leipzig), 36, 113-119.
14. Mackenzie, J. K. & Mathieson, A. McL. (1992). Acta Cryst. A48, 231-236.
15. Rocher, A. M. & Jouffrey, B. (1972). Electron Microscopy 1972. Inst. Phys. Conf. Ser. No. 14, pp. 528-529. London/Bristol: The Institute of Physics.
16. Saunders, M., Bird, D. M., Zaluzec, N. J., Burgess, W. G., Preston, A. R. & Humphreys, C. J. (1995). Ultramicroscopy, 60, 311-323.
17. Saunders, M., Fox, A. G. & Midgley, P. A. (1999). Acta Cryst. A55, 480-488.
18. Saunders, M., Midgley, P. A., Walsh, T. D., Menon, E. S. K., Fox, A. G. & Vincent, R. (1999). Scanning Microsc. Suppl. 11. In the press.
19. Schneider, J. R., Hansen, N. K. & Kretschmer, H. (1981). Acta Cryst. A37, 711-722.
20. Smart, D. J. & Humphreys, C. J. (1980). Electron Microscopy and Analysis 1979. Inst. Phys. Conf. Ser. No. 52C, ch. 4, pp. 528-529. London/Bristol: The Institute of Physics.
21. Spence, J. C. H. & Zuo, J. M. (1992). Electron Microdiffraction. New York: Plenum.
22. Takama, T. & Sato, S. (1982). Philos. Mag. B45, 615-626.
23. Tanaka, M. (1989). J. Electron Microsc. Tech. 13, 27-39.
24. Thomas, L. E., Shirley, C. G., Lally, J. S. & Fisher, R. M. (1974). High Voltage Electron Microscopy, pp. 38-47. London/New York: Academic Press.
25. Van Dyck, D. (1997). Microsc. Microanal. 3, (Suppl. 2), 1139-1140.
26. Wakoh, S. & Yamashita, J. (1971). J. Phys. Soc. Jpn, 30, 422-427.
27. Wang, C. S. & Callaway, J. (1977). Phys. Rev. B, 15, 298-306.
28. Zuo, J. M. (1992). Ultramicroscopy, 41, 211-223.