Interferometry by coherent convergent-beam electron diffraction

Journal of Electron Microscopy

Volumn 45, Issue 1, 1996, Pages 59-63

  Tsuda, Kenji ^a   Tanaka, Michiyoshi ^a  

^a TOHOKU UNIVERSITY   (Japan)

Author keywords

Coherent electron beam; Convergent beam electron diffraction; Interference fringes; Interferometry; Stacking fault

Indexed keywords

ELECTRONS; III-V SEMICONDUCTORS; INTERFEROMETRY; STACKING FAULTS; TITANIUM DIOXIDE;

COHERENT ELECTRON BEAM; CONVERGENT BEAMS; CONVERGENT-BEAM ELECTRON DIFFRACTION; DIFFRACTION METHODS; DISPLACEMENT VECTORS; ELECTRON DIFFRACTION PATTERN; ELECTRON-BEAM; INTERFERENCE FRINGE; LATTICE SPACING; TWO WAVES;

ELECTRON DIFFRACTION;

EID: 0002012489     PISSN: 00220744     EISSN: None     Source Type: Journal    
DOI: 10.1093/oxfordjournals.jmicro.a023413     Document Type: Article

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