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Physical Review Letters

Volumn 99, Issue 12, 2007, Pages

Thickness difference: A new filtering tool for quantitative electron diffraction

(1) Nakashima, Philip N H a

a MONASH UNIVERSITY (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; INELASTIC SCATTERING; THERMAL DIFFUSION; THICKNESS MEASUREMENT; UNCERTAINTY ANALYSIS;

BORRMANN EFFECTS; ENERGY FILTERING; FILTERING TOOLS;

ELECTRON DIFFRACTION;

EID: 34648831933 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.99.125506 Document Type: Article

Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.