Controllable filament with electric field engineering for resistive switching uniformity

IEEE Electron Device Letters

Volumn 32, Issue 9, 2011, Pages 1167-1169

  Sun, Qing Qing ^a   Gu, Jing Jing ^a   Chen, Lin ^a   Zhou, Peng ^a   Wang, Peng Fei ^a   Ding, Shi Jin ^a   Zhang, David Wei ^a  

^a FUDAN UNIVERSITY   (China)

Author keywords

Conical filament model; electric field engineering; parameters dispersion; random circuit breaker (RCB) model

Indexed keywords

CIRCUIT BREAKER; CONDUCTING FILAMENT; CONICAL FILAMENT MODEL; FIELD REDISTRIBUTION; LARGE REGIONS; MEMORY APPLICATIONS; NETWORK MODELS; PARAMETERS DISPERSION; RANDOM DISTRIBUTION; RESET VOLTAGE; RESISTIVE SWITCHING; SET VOLTAGE; SWITCHING BEHAVIORS; ULTRA-THIN;

CAPACITANCE; CIRCUIT BREAKING ARCS; ELECTRIC CIRCUIT BREAKERS; SWITCHING SYSTEMS; TRANSITION METALS; VOLTAGE DISTRIBUTION MEASUREMENT; VOLTAGE DIVIDERS;

ELECTRIC FIELDS;

EID: 80052024837     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2159770     Document Type: Article

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