XPS and AES studies of the Cr/Al2O3 interface

Physica Status Solidi (A) Applied Research

Volumn 159, Issue 2, 1997, Pages 425-437

  Lu, Hua ^a   Shen, D H ^a   Bao, C L ^a   Wang, Y X ^a  

^a INSTITUTE OF GEOLOGY AND GEOPHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINA; ANNEALING; AUGER ELECTRON SPECTROSCOPY; BAND STRUCTURE; CHROMIUM; OXIDATION; SURFACE PHENOMENA; THERMAL EFFECTS; X RAY PHOTOELECTRON SPECTROSCOPY;

AUGER PEAK TO PEAK HEIGHT (APPH); OXIDATION STATE;

INTERFACES (MATERIALS);

EID: 0031071188     PISSN: 00318965     EISSN: None     Source Type: Journal    
DOI: 10.1002/1521-396X(199702)159:2<425::AID-PSSA425>3.0.CO;2-W     Document Type: Article

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