A quantitative procedure to probe for compositional inhomogeneities in InxGa1-xN alloys

Ultramicroscopy

Volumn 108, Issue 11, 2008, Pages 1420-1426

  Bartel, T P ^a,b   Kisielowski, C ^a  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

Author keywords

Clustering; InGaN; Quantitative HRTEM; Strain

Indexed keywords

CLUSTERING; INGAN; QUANTITATIVE HRTEM; STRAIN;

GALLIUM; INDIUM; NICKEL;

ACCURACY; ARTICLE; EXTRACTION; MOLECULAR PROBE; PARTICLE SIZE; PIEZOELECTRICITY; PREDICTION; QUANTITATIVE ANALYSIS; QUANTUM MECHANICS; REPRODUCIBILITY; SIMULATION; THICKNESS;

EID: 53249093781     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.096     Document Type: Article

References (36)

1. Nakamura S., and Chichibu S.F. Introduction to Nitride Semiconductor Blue Laser and Light Emitting Diodes (2000), Taylor&Francis, London
2. Hytch M.J., Snoeck E., and Kilaas R. Ultramicroscopy 74 3 (1998) 131
3. Christiansen S., Albrecht M., Strunk H.P., et al. Appl. Phys. Lett. 64 26 (1994) 3617
4. Rosenauer A., Fischer U., Gerthsen D., et al. Ultramicroscopy 72 3-4 (1998) 121
5. Kisielowski C., Liliental-Weber Z., and Nakamura S. Jpn. J. Appl. Phys. 36 (1997) 6932
6. Bartel T.P., Specht P., Ho J.C., et al. Philos. Mag. 87 13 (2007) 1983
7. Shapiro N.A., Perlin P., Kisielowski C., et al. MRS Internet J. Nitride Semicond. Res. 5 1 (2000)
8. Bartel T., Dworzak M., Strassburg M., et al. Appl. Phys. Lett. 85 11 (2004) 1946
9. Humphreys C.J. Philos. Mag. 87 13 (2007) 1971
10. O'Neill J.P., Ross I.M., Cullis A.G., et al. Appl. Phys. Lett. 83 10 (2003) 1965
11. Smeeton T.M., Humphreys C.J., Barnard J.S., et al. J. Mater. Sci. 41 9 (2006) 2729
12. Jinschek J.R., and Kisielowski C. Phys. B 376-377 (2006) 536
13. Bartel T., Jinschek J.R., Freitag B., et al. Phys. Stat. Sol. (a) 203 1 (2006) 167
14. R. Kilaas, MacTempas, available at 〈http://www.totalresolution.com/〉.
15. Boothroyd C.B. J. Microsc. 190 (1998) 99
16. Hytch, and Herring. Microsc. Microanal. 13 Suppl. 2 (2007) 874CD
17. Bentley J. Ultramicroscopy 30 1-2 (1989) 157
18. Kisielowski C., and Schmidt O. Microsc. Microanal. 4 2 (1998) 614
19. C. Kisielowski, presented at the 2nd International Symposium of Blue Laser and Light Emitting Diodes, 1998, p. 381.
20. Gibson J.M., Hull R., Bean J.C., et al. Appl. Phys. Lett. 46 7 (1985) 649
21. Gibson J.M., and Treacy M.M.J. Ultramicroscopy 14 4 (1984) 345
22. Treacy M.M.J., and Gibson J.M. J. Vac. Sci. Tech. B 4 6 (1986) 1458
23. Gerthsen D., Potin V., and Rosenauer A. Phys. Stat. Sol. (a) 203 (2006) 176
24. Tillmann K., Lentzen M., and Rosenfeld R. Ultramicroscopy 83 1-2 (2000) 111
25. De Caro L., Giuffrida A., Carlino E., et al. Acta Crystallogr. A 53 2 (1997) 168
26. Cherns D., and Preston A.R. J. Electron. Microsc. Technol. 13 2 (1989) 111
27. Mefisto FE package, available from 〈http://www.ann.jussieu.fr/~perronnet/mefisto.gene.html〉.
28. Lagerstedt O., and Monemar B. Phys. Rev. B 19 6 (1979) 3064
29. Sheleg A.U., and Savastenko V.A. Ser. Fiz. Mater. Nauk 3 (1976) 126
30. Polian A., Grimsditch M., and Grzegory I. J. Appl. Phys. 79 6 (1996) 3343
31. McNeil L.E., Grimsditch M., and French R.H. J. Am. Ceram. Soc. 76 5 (1993) 1132
32. Hytch M.J., and Plamann T. Ultramicroscopy 87 4 (2001) 199
33. Zheng J.F., Walker J.D., Salmeron M.B., et al. Phys. Rev. Lett. 73 2 (1994) 368
34. Kisielowski C., Bartel T.P., Specht P., et al. Physica B 401 (2007) 639
35. Galtrey M.J., Oliver R.A., Kappers M.J., et al. Appl. Phys. Lett. 90 6 (2007) 061903
36. Kisielowski C., and Bartel T.P. Appl. Phys. Lett 91 (2007) 176101