Thermal drift study on different commercial scanning probe microscopes during the initial warming-up phase

Measurement Science and Technology

Volumn 22, Issue 9, 2011, Pages

  Marinello, F ^a   Balcon, M ^a   Schiavuta, P ^b   Carmignato, S ^a   Savio, E ^a  

^a UNIVERSITY OF PADOVA   (Italy)

^b CIVEN   (Italy)

Author keywords

atomic force microscopy; distortions; scanning probe microscopy; thermal drift

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; DISTORTION (WAVES); HYDROPHOBICITY; SURFACE TOPOGRAPHY;

DRIFT CHARACTERIZATION; ENVIRONMENTAL CONDITIONS; EXPERIMENTAL PROCEDURE; HIGHEST RESOLUTIONS; INSTRUMENT PERFORMANCE; REPEATED MEASUREMENTS; TEMPERATURE DEPENDENT; THERMAL DRIFTS;

SCANNING PROBE MICROSCOPY;

EID: 80051682087     PISSN: 09570233     EISSN: 13616501     Source Type: Journal    
DOI: 10.1088/0957-0233/22/9/094016     Document Type: Article

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