Acquisition of high-precision images for non-contact atomic force microscopy

Mechatronics

Volumn 16, Issue 10, 2006, Pages 655-664

  Pishkenari, Hossein Nejat ^a   Jalili, Nader ^b   Meghdari, Ali ^a  

^a Robotics and Automation   (Iran)

^b Clemson University   (United States)

Author keywords

Atomic force microscopy (AFM); High resolution images and microcantilever; Non contact AFM; Sample tip distance identification

Indexed keywords

ATOMIC FORCE MICROSCOPY; COMPUTER SIMULATION; DEFLECTION (STRUCTURES); FORCE MEASUREMENT; OPTICAL RESOLVING POWER; SCANNING;

HIGH-RESOLUTION IMAGES; MICROCANTILEVERS; NON-CONTACT AFM; SAMPLE-TIP DISTANCE IDENTIFICATION;

IMAGE ANALYSIS;

EID: 33750488169     PISSN: 09574158     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mechatronics.2006.04.002     Document Type: Article

References (22)

1. Jalili N., and Laxminarayana K. A review of atomic force microscopy imaging systems: application to molecular metrology and biological sciences. Int J Mech 14 8 (2004) 907-945
2. Goeken M., and Kempf M. Microstructural properties of super alloys investigated by nanoindentations in an atomic force microscope. Acta Mater. 47 3 (1999) 1043-1052
3. Kempf M., Goëken M., and Vehoff H. Nanohardness measurements for studying local mechanical properties of metals. Appl Phys A: Mater Sci Process 66 (1998) S843-S846
4. Nagashima N., Matsuoka S., and Miyahara K. Nanoscopic hardness measurement by atomic force microscope. JSME Int J A: Mech Mater Eng 39 3 (1996) 456-462
5. Gahlin R., and Jacobson S. Novel method to map and quantify wear on a micro-scale. Wear 222 2 (1998) 93-102
6. Miyahara K., Nagashima N., Ohmura T., and Matsuoka S. Evaluation of mechanical properties in nanometer scale using AFM-based nanoindentation tester. Nanostruct Mater 12 5 (1999) 1049-1052
7. Sundararajan S., and Bhushan B. Development of a continuous microscratch technique in an atomic force microscope and its application to study scratch resistance of ultrathin hard amorphous carbon coatings. J Mater Res 16 2 (2001) 437-445
8. Chen W., Ahmed H., and Nakazoto K. Coulomb blockade at 77 K in nanoscale metallic islands in a lateral nanostructure. Appl Phys Lett 66 24 (1995) 3383-3384
9. Klein D.L., McEuen P.L., Katari J.E.B., Roth R., and Alivisatos A.P. Approach to electrical studies of single nanocrystals. Appl Phys Lett 68 18 (1996) 2574-2576
10. Bezryadin A., Dekker C., and Schmid G. Electrostatic trapping of single conducting nanoparticles between nanoelectrodes. Appl Phys Lett 71 9 (1997) 1273-1275
11. Jalili N., Dadfarnia M., and Dawson D.M. A fresh insight into the microcantilever-sample interaction problem in non-contact atomic force microscopy. ASME J Dyn Syst Measure Control 126 2 (2004) 327-335
12. Sebastian A, Salapaka M, Chen D, Cleveland J. Harmonic analysis based modeling of tapping-mode AFM. In: Proceedings of the American control conference, San Diego, CA, 1999. p. 232-6.
13. Basso M, Giarre L, Dahleh M, Mezic I. Numerical analysis of complex dynamics in atomic force microscopes. In: Proceedings of the IEEE conference on control applications, Trieste, Italy, 1998. p. 1026-30.
14. Ashhab M., Salapaka M., Dahleh M., and Mezic I. Dynamical analysis and control of microcantilevers. Automatica 35 (1999) 1663-1670
15. Hsu S, Fu L. 1999, Robust output high-gain feedback controllers for the atomic force microscope under high data sampling rate. In: Proceedings of the IEEE international conference on control applications, Kohala Coast-Island, HI, p. 1626-31.
16. Fang Y, Feemster MG, Dawson DM, Jalili N. Nonlinear control techniques for the atomic force microscope system. In: Proceedings of the 2002 ASME international mechanical engineering congress and exposition, November 2002, New Orleans, LA, USA.
17. Kupnizky J. Nanostructures studied by AFM. Thesis from Acta University.
18. Sahoo D.R., Sebastian A., and Salapaka M.V. Transient-signal-based sample-detection in atomic force microscopy. Appl Phys Lett 83 26 (2003) 5521-5523
19. Parlitz U., Junge L., and Kocarev L. Synchronization-based parameter estimation from time series. Phys Rev E 54 (1996) 6253-6259
20. Parlitz U. Estimating model parameters from time series by autosynchronization. Phys Rev Lett 76 (1996) 1232-1235
21. Maybhate A, Amritkar RE. Use of synchronization and adaptive control in parameter identification from time series. Preprint available from: http://xxx.lanl.gov/abs/chao-dyn/9804005.
22. Pecora L., and Carroll T. Synchronization of chaotic systems. Phys Rev Lett 64 (1990) 821-824