Fast scanning using piezoelectric tube nanopositioners: A negative imaginary approach

IEEE/ASME International Conference on Advanced Intelligent Mechatronics, AIM

Volumn , Issue , 2009, Pages 274-279

  Bhikkaji, B ^a   Moheimani, S O R ^b  

^a INDIAN INSTITUTE OF TECHNOLOGY MADRAS   (India)

^b UNIVERSITY OF NEWCASTLE   (Australia)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; ATOMIC FORCE MICROSCOPES; FAST SCANNING; INTEGRAL RESONANT CONTROLS; NANO SCALE; NANOPOSITIONERS; PIEZOELECTRIC TUBES; RESONANT MODE; SCANNING FREQUENCY; SCANNING RATE;

ASYMPTOTIC ANALYSIS; ATOMIC FORCE MICROSCOPY; FEEDBACK; MECHATRONICS; PIEZOELECTRIC TRANSDUCERS; PIEZOELECTRICITY; SCANNING; TUBES (COMPONENTS);

INTELLIGENT MECHATRONICS;

EID: 70350447361     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/AIM.2009.5230001     Document Type: Conference Paper

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