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Applied Physics Letters

Volumn 99, Issue 5, 2011, Pages

Measuring the short-range force field above a single molecule with atomic resolution

(3) Mohn, Fabian a Gross, Leo a Meyer, Gerhard a

a IBM RESEARCH ZURICH (Switzerland)

Author keywords

[No Author keywords available]

Indexed keywords

ADSORPTION GEOMETRIES; ATOMIC RESOLUTION; ATOMIC SCALE; NONCONTACT ATOMIC FORCE MICROSCOPY; SCANNING PROBES; SHORT-RANGE FORCES; SINGLE MOLECULE;

ADSORPTION; ATOMIC FORCE MICROSCOPY;

MOLECULES;

EID: 80051592659 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.3619829 Document Type: Article

Times cited : (56)

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