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Volumn 84, Issue 4, 2011, Pages

Ab initio parameterized valence force field for the structure and energetics of amorphous SiOx (0≤x≤2) materials

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EID: 79961184432     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.045202     Document Type: Article
Times cited : (11)

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