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Volumn 69, Issue 14, 1996, Pages 2033-2035

Defect-related versus excitonic visible light emission from ion beam synthesized Si nanocrystals in SiO2

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[No Author keywords available]

Indexed keywords


EID: 0042140898     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.116870     Document Type: Article
Times cited : (413)

References (16)
  • 9
    • 36449003068 scopus 로고
    • H. M. Cheong, W. Paul, S. P. Withrow, J. G. Zhu, J. D. Budai, C. W. White, and D. M. Hembree, Jr., Appl. Phys. Lett. 68, 87 (1996); J. G. Zhu, C. W. White, J. D. Budai, S. P. Withrow, and Y. Chen, J. Appl. Phys. 78, 4386 (1995).
    • (1995) J. Appl. Phys. , vol.78 , pp. 4386
    • Zhu, J.G.1    White, C.W.2    Budai, J.D.3    Withrow, S.P.4    Chen, Y.5


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.