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Volumn 83, Issue 20, 2011, Pages

Composition profiling of InAs quantum dots and wetting layers by atom probe tomography and cross-sectional scanning tunneling microscopy

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[No Author keywords available]

Indexed keywords


EID: 79961137702     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.83.205308     Document Type: Article
Times cited : (48)

References (31)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.