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Volumn 104-105, Issue , 1996, Pages 516-521

Surface and subsurface imaging of indium in InGaAs by scanning tunneling microscopy

(8) Pfister, M a,b,c Johnson, M B a,d Alvarado, S F a Salemink, H W M a Marti, U b Martin, D b Morier Genoud, F b Reinhart, F K b

a IBM RESEARCH ZURICH (Switzerland)

b EPFL (Switzerland)

c UNIVERSITY OF ILLINOIS AT URBANA CHAMPAIGN (United States)

d UNIVERSITY OF OKLAHOMA (United States)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGING TECHNIQUES; INDIUM; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; SEMICONDUCTOR QUANTUM WELLS; SEMICONDUCTOR QUANTUM WIRES; SURFACES;

SURFACE IMAGING;

SEMICONDUCTING GALLIUM ARSENIDE;

EID: 0030232374 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/S0169-4332(96)00196-1 Document Type: Article

Times cited : (3)

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