SCOPUS 정보 검색 플랫폼

Volumn 92, Issue 26, 2008, Pages

Relation between magnetoresistance and nanostructure of current-perpendicular-to-plane giant-magnetoresistance film with current-confined-path nano-oxide layer

(3) Yuasa, Hiromi a Hara, Michiko a Fukuzawa, Hideaki a

a TOSHIBA CORPORATION (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLINE MATERIALS; ELECTRIC BREAKDOWN; ELECTRIC RESISTANCE; ELECTRON ENERGY LOSS SPECTROSCOPY; GALVANOMAGNETIC EFFECTS; GIANT MAGNETORESISTANCE; HIGH RESOLUTION ELECTRON MICROSCOPY; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; MAGNETIC FIELDS; MAGNETISM; MAGNETOELECTRONICS; MAGNETORESISTANCE; NANOSTRUCTURES; STEEL ANALYSIS; THREE DIMENSIONAL; TRANSMISSION ELECTRON MICROSCOPY;

AMERICAN INSTITUTE OF PHYSICS (AIP); CRYSTALLINE ORIENTATIONS; CURRENT PERPENDICULAR TO PLANE (CPP); HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HR-TEM); HIGH-PURITY; MAGNETO-RESISTANCE (MR) RATIO; NANO STRUCTURING; NANO-OXIDE-LAYER (NOL); THREE DIMENSIONAL ATOM PROBE (3 DAP); WELL CRYSTALLIZED; WELL-CRYSTALLIZED;

MAGNETIC FIELD EFFECTS;

EID: 46649105502 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.2952773 Document Type: Article

Times cited : (7)

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