Comparison of electronic and mechanical contrast in scanning tunneling microscopy images of semiconductor heterojunctions

Physica B: Condensed Matter

Volumn 273-274, Issue , 1999, Pages 796-802

  Feenstra, R M ^a  

^a CARNEGIE MELLON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING INDIUM COMPOUNDS; STRAIN;

INDIUM GALLIUM ARSENIC PHOSPHIDE;

HETEROJUNCTIONS;

EID: 0033357804     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0921-4526(99)00507-4     Document Type: Article

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