Direct imaging of the atomic structure inside a nanowire by scanning tunnelling microscopy

Nature Materials

Volumn 3, Issue 8, 2004, Pages 519-523

  Mikkelsen, Anders ^a   Sköld, Niklas ^a   Ouattara, Lassana ^a   Borgström, Magnus ^a   Andersen, Jesper N ^a   Samuelson, Lars ^a   Seifert, Werner ^a   Lundgren, Edvin ^a  

^a LUND UNIVERSITY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

AGGLOMERATION; CRYSTAL ATOMIC STRUCTURE; ELECTRONIC STRUCTURE; FIELD EFFECT TRANSISTORS; IMAGING SYSTEMS; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTING GALLIUM ARSENIDE; SEMICONDUCTOR QUANTUM DOTS; TRANSMISSION ELECTRON MICROSCOPY; ZINC COMPOUNDS;

NANOELECTRONICS; NANOWIRES; SINGLE-ATOM IMPURITIES; ZINC-BLENDE STRUCTURE;

NANOSTRUCTURED MATERIALS;

GALLIUM; GALLIUM ARSENIDE; NANOTUBE; ORGANOARSENIC DERIVATIVE;

ARTICLE; CHEMISTRY; CONFORMATION; CRYSTALLOGRAPHY; ELECTRICITY; EVALUATION; MATERIALS; MATERIALS TESTING; METHODOLOGY; NANOTECHNOLOGY; SCANNING TUNNELING MICROSCOPY; SEMICONDUCTOR; SURFACE PROPERTY; ULTRASTRUCTURE;

ARSENICALS; CRYSTALLOGRAPHY; ELECTRIC WIRING; GALLIUM; MANUFACTURED MATERIALS; MATERIALS TESTING; MICROSCOPY, SCANNING TUNNELING; MOLECULAR CONFORMATION; NANOTECHNOLOGY; NANOTUBES; SEMICONDUCTORS; SURFACE PROPERTIES;

EID: 3342987423     PISSN: 14761122     EISSN: None     Source Type: Journal    
DOI: 10.1038/nmat1164     Document Type: Article

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