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Current Applied Physics

Volumn 11, Issue 2 SUPPL., 2011, Pages

Unified physical modeling of reliability mechanisms and scaling perspective of phase change memory

(1) Ielmini, Daniele a

a POLITECNICO DI MILANO (Italy)

Author keywords

Chalcogenide glasses; Nonvolatile memory; Phase change memory; Structural relaxation

Indexed keywords

AMORPHOUS CHALCOGENIDE; AMORPHOUS PHASE; CHALCOGENIDE GLASS; CURRENT FLUCTUATIONS; DOWN-SCALING; EMBEDDED MEMORY TECHNOLOGIES; NON-VOLATILE MEMORIES; PHASE CHANGE; PHYSICAL MODELING; QUANTITATIVE PREDICTION; STATISTICAL VARIABILITY;

CRYSTALLIZATION; MODELS; STRUCTURAL RELAXATION;

PHASE CHANGE MEMORY;

EID: 79960910425 PISSN: 15671739 EISSN: None Source Type: Journal
DOI: 10.1016/j.cap.2010.09.021 Document Type: Article

Times cited : (7)

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