Unified mechanisms for structural relaxation and crystallization in phase-change memory devices

Microelectronic Engineering

Volumn 86, Issue 7-9, 2009, Pages 1942-1945

  Ielmini, D ^a   Boniardi, M ^a   Lacaita, A L ^a   Redaelli, A ^b   Pirovano, A ^b  

^a POLITECNICO DI MILANO   (Italy)

^b Numonyx   (Italy)

Author keywords

Crystallization; Many body thermal excitation; Meyer Neldel rule; Phase change memory (PCM); Structural relaxation

Indexed keywords

AMORPHOUS CHALCOGENIDE; ARRHENIUS; DATA RETENTION; IN-PHASE; MANY-BODY; MANY-BODY THERMAL EXCITATION; MEYER-NELDEL RULE; MEYER-NELDEL RULES; PHASE-CHANGE MEMORY (PCM); PHYSICAL INTERPRETATION; PHYSICAL PHENOMENA; THERMAL EXCITATION;

ACTIVATION ENERGY; CRYSTALLIZATION KINETICS; PULSE CODE MODULATION; STRUCTURAL RELAXATION;

PHASE CHANGE MEMORY;

EID: 67349217820     PISSN: 01679317     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mee.2009.03.085     Document Type: Article

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