Voltage preamplifier for extensional quartz sensors used in scanning force microscopy

Review of Scientific Instruments

Volumn 82, Issue 6, 2011, Pages

  Morawski, Ireneusz ^a,b   Blicharski, Jzef ^c   Voigtlnder, Bert ^a  

^a FORSCHUNGSZENTRUM JÜLICH   (Germany)

^b UNIVERSITY OF WROC AW   (Poland)

^c AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

AFM IMAGE; CURRENT-TO-VOLTAGE CONVERTERS; DYNAMIC SCANNING; FORCE SENSOR; QUARTZ RESONATORS; QUARTZ SENSORS; SI (1 1 1); SIGNAL TO NOISE; TUNNELING CURRENT; VOLTAGE PREAMPLIFIER;

ATOMIC FORCE MICROSCOPY; CRYSTAL RESONATORS; QUARTZ; SCANNING TUNNELING MICROSCOPY; SENSORS; SIGNAL TO NOISE RATIO; SILICON COMPOUNDS;

AMPLIFIERS (ELECTRONIC);

EID: 79960151474     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3594103     Document Type: Article

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