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Applied Physics Letters

Volumn 86, Issue 1, 2005, Pages

Crystal sensor for microscopy applications

(2) Peng, Zhiqiang a West, Paul a

a Pacific Nanotechnology Inc (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELASTIC MODULI; ELECTRIC POTENTIAL; NATURAL FREQUENCIES; NEAR FIELD SCANNING OPTICAL MICROSCOPY; OPTICAL SENSORS; OSCILLATORS (MECHANICAL); PIEZOELECTRIC DEVICES; QUARTZ; RESONANCE;

CRYSTAL SENSORS; SHEAR FORCE; TUNING FORKS; VOLTAGE SOURCE;

CRYSTALS;

EID: 19744382938 PISSN: 00036951 EISSN: None Source Type: Journal
DOI: 10.1063/1.1846156 Document Type: Article

Times cited : (14)

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