|
Volumn 205, Issue 21-22, 2011, Pages 5068-5072
|
Microstructure and mechanical properties of hard Ti-Si-C-N films deposited by dc magnetron sputtering of multicomponent Ti/C/Si target
|
Author keywords
Magnetron sputtering; Mechanical properties; Nanocomposite; Structure
|
Indexed keywords
AMORPHOUS PHASE;
DC MAGNETRON SPUTTERING;
FRICTION COEFFICIENTS;
MAXIMUM VALUES;
MICROSTRUCTURE AND MECHANICAL PROPERTIES;
MULTICOMPONENTS;
NANO-COMPOSITE STRUCTURE;
NANO-INDENTATION HARDNESS;
PURE TIN;
SCRATCH TEST;
SI (100) SUBSTRATE;
SILICON CONTENTS;
AMORPHOUS FILMS;
FRICTION;
MAGNETRON SPUTTERING;
MECHANICAL PROPERTIES;
METALLIC FILMS;
NANOCOMPOSITE FILMS;
NANOCOMPOSITES;
NANOINDENTATION;
PHOTOELECTRON SPECTROSCOPY;
SILICON;
SILICON NITRIDE;
TITANIUM NITRIDE;
X RAY DIFFRACTION;
X RAY PHOTOELECTRON SPECTROSCOPY;
AMORPHOUS SILICON;
|
EID: 79959529117
PISSN: 02578972
EISSN: None
Source Type: Journal
DOI: 10.1016/j.surfcoat.2011.05.009 Document Type: Article |
Times cited : (22)
|
References (26)
|