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Volumn 519, Issue 19, 2011, Pages 6369-6373

Interpretation of the two-components observed in high resolution X-ray diffraction ω scan peaks for mosaic ZnO thin films grown on c-sapphire substrates using pulsed laser deposition

Author keywords

Heteroepitaxy; Misfit dislocations; Thin films; Transverse scans; X ray scattering; Zinc oxide

Indexed keywords

C-SAPPHIRE; FILM-SUBSTRATE INTERFACES; HIGH RESOLUTION; HIGH RESOLUTION X RAY DIFFRACTION; LONG RANGE CORRELATIONS; NON DESTRUCTIVE TESTING; ROCKING CURVES; STRUCTURAL CORRELATION; STRUCTURAL QUALITIES; TRANSVERSE SCANS; TWO-COMPONENT; WILLIAMSON-HALL; ZNO; ZNO LAYERS; ZNO THIN FILM;

EID: 79958224388     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2011.04.036     Document Type: Article
Times cited : (36)

References (44)
  • 19
    • 79958229421 scopus 로고
    • 2nd ed John Wiley New-York L.E.
    • H.P. Klug, and L.E. Alexander 2nd ed 1974 John Wiley New-York 618
    • (1974) , pp. 618
    • Klug, H.P.1    Alexander2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.