Study of the structural evolution in ZnO thin film by in situ synchrotron x-ray scattering

Journal of Applied Physics

Volumn 96, Issue 3, 2004, Pages 1740-1742

  Hur, Tae Bong ^a   Hwang, Yoon Hwae ^a   Kim, Hyung Kook ^a   Park, Hong Lee ^b  

^a Pusan National University   (South Korea)

^b Yonsei University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; BINDING ENERGY; COMPUTER SIMULATION; ELECTROLUMINESCENCE; MAGNETRON SPUTTERING; SAPPHIRE; SURFACE ROUGHNESS; SYNCHROTRONS; X RAY SCATTERING; ZINC OXIDE;

POHANG LIGHT SOURCE (PLS); SILICON MIRROR; SPUTTERING CHAMBER; STRAIN RELAXATION;

THIN FILMS;

EID: 4043147299     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1762706     Document Type: Article

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