Evolution of the microstructure of oxide thin films

Journal of Crystal Growth

Volumn 170, Issue 1-4, 1997, Pages 799-802

  Becht, M ^a   Wang, F ^a   Wen, J G ^a   Morishita, T ^a  

^a SUPERCONDUCTIVITY RESEARCH LABORATORY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

CERAMIC MATERIALS; CERIUM COMPOUNDS; FILM GROWTH; MICROSCOPIC EXAMINATION; MICROSTRUCTURE; OXIDES; RUTHERFORD BACKSCATTERING SPECTROSCOPY; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

OXIDE THIN FILMS;

METALLORGANIC CHEMICAL VAPOR DEPOSITION;

EID: 0030709857     PISSN: 00220248     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0022-0248(96)00563-5     Document Type: Article

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