Highly localized strain fields due to planar defects in epitaxial SrBi2 Nb2 O9 thin films

Journal of Applied Physics

Volumn 97, Issue 7, 2005, Pages

  Boulle, A ^a   Guinebretire R ^a   Dauger, A ^a  

^a Ecole Nationale Superieure de Ceramique Industrielle   (France)

Author keywords

[No Author keywords available]

Indexed keywords

DIFFUSE SCATTERING; PLANAR DEFECTS; SPACE MAPPING; STRAIN FIELDS;

EPITAXIAL GROWTH; GRAIN GROWTH; PEROVSKITE; SOL-GELS; STACKING FAULTS; STRAIN; STRONTIUM COMPOUNDS; X RAY DIFFRACTION;

THIN FILMS;

EID: 17444393958     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1870119     Document Type: Article

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