Specular and diffuse reflectivity from thin films containing misfit dislocations

Physica B: Condensed Matter

Volumn 221, Issue 1-4, 1996, Pages 230-234

  Miceli, P F ^a   Weatherwax, J ^a   Krentsel, T ^a   Palmstrom C J ^b  

^a UNIVERSITY OF MISSOURI   (United States)

^b University of Minnesota   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; DISLOCATIONS (CRYSTALS); ELECTROMAGNETIC WAVE SCATTERING; INTERFACES (MATERIALS); MATHEMATICAL MODELS; ORDER DISORDER TRANSITIONS; SEMICONDUCTING GALLIUM ARSENIDE; THIN FILMS;

BRAGG REFLECTIONS; CORRELATION LENGTH; DIFFUSE SCATTERING; INTERFACIAL DISPLACEMENT DIFFERENCE CORRELATION FUNCTION; SPECULAR SCATTERING; X RAY REFLECTIVITY;

SEMICONDUCTING FILMS;

EID: 0030563014     PISSN: 09214526     EISSN: None     Source Type: Journal    
DOI: 10.1016/0921-4526(95)00930-2     Document Type: Article

References (19)

1. W.H. Zachariasen, Theory of X-ray Diffraction in Crystals (Dover, New York, 1967); G.E. Bacon, Neutron Diffraction (Oxford University Press, Oxford, 1975).
2. W.H. Zachariasen, Theory of X-ray Diffraction in Crystals (Dover, New York, 1967); G.E. Bacon, Neutron Diffraction (Oxford University Press, Oxford, 1975).
3. M.A. Krivoglaz, Theory of X-ray and Thermal-Neutron Scattering By Real Crystals (Plenum, New York, 1969).
4. P.F. Miceli and C.J. Palmstrøm, Phys. Rev. B 51 (1995) 5506.
5. P.M. Reimer, H. Zabel, C.P. Flynn and J.A. Dura, Phys. Rev. B 45 (1992) 11 426; J. Cryst. Growth 127 (1993) 643.
6. P.M. Reimer, H. Zabel, C.P. Flynn and J.A. Dura, Phys. Rev. B 45 (1992) 11 426; J. Cryst. Growth 127 (1993) 643.
7. A. Stierle, A. Abromeit, N. Metoki and H. Zabel, J. Appl. Phys. 73 (1993) 4808.
8. A. Gibaud, R.A. Cowley, D.F. McMorrow, R.C.C. Ward and M.R. Wells, Phys. Rev. B 48 (1993) 14 463.
9. A. Gibaud, D.F. McMorrow and P.P. Swaddling, unpublished manuscript.
10. P.M. Reimer, H. Zabel, C.P. Flynn and K. Ritley, unpublished manuscript.
11. P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, Appl. Phys. Lett. 58 (1991) 1602; P.F. Miceli, K.W. Moyers and C.J. Palmstrøm, Mat. Res. Soc. Symp. Proc. 202 (1991) 579.
12. P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, Appl. Phys. Lett. 58 (1991) 1602; P.F. Miceli, K.W. Moyers and C.J. Palmstrøm, Mat. Res. Soc. Symp. Proc. 202 (1991) 579.
13. C.J. Palmstrøm, N. Tabatabaie and S.J. Allen, Appl. Phys. Lett. 53 (1988) 2608.
14. P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, Appl. Phys. Lett 61 (1992) 2060; P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, in: Surface X-ray and Neutron Scattering, eds. H. Zabel and I.K. Robinson (Springer, Berlin, 1992) p. 203.
15. P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, Appl. Phys. Lett 61 (1992) 2060; P.F. Miceli, C.J. Palmstrøm and K.W. Moyers, in: Surface X-ray and Neutron Scattering, eds. H. Zabel and I.K. Robinson (Springer, Berlin, 1992) p. 203.
16. P.F. Miceli, in: Semiconductor Interfaces Microstructures and Devices: Properties and Applications, ed. Z.C. Feng (IOP, Bristol, 1993) p. 87.
17. S.K. Sinha, E.B. Sirota, S. Garoff and H.B. Stanley, Phys. Rev. B 38 (1988) 2297.
18. It is to be noted that our model gives a conventional mosaic crystal in the limit of very strong disorder and such mosaic scattering is often observed in thin films. For example, see V. Hôly, J. Kubena, E. Abramof, K. Lischka, A. Pesek and E. Koppensteiner, J. Appl. Phys. 74 (1993) 1736.
19. J.P. Hirth and J. Lothe, Theory of Dislocations (Wiley, New York, 1982).