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Volumn 38, Issue 1, 2005, Pages 183-192

Analysis of the mosaic structure of an ordered (Al,Ga)N layer

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; GALLIUM; NITROGEN;

EID: 13844321269     PISSN: 00218898     EISSN: None     Source Type: Journal    
DOI: 10.1107/S0021889804030675     Document Type: Article
Times cited : (38)

References (40)
  • 3
    • 0002029775 scopus 로고    scopus 로고
    • edited by R. L. Snyder, J. Fiala & H. J. Bunge, Oxford University Press
    • Balzar, D. (1999). Defect and Microstructure Analysis by Diffraction, edited by R. L. Snyder, J. Fiala & H. J. Bunge, pp. 94-126. Oxford University Press.
    • (1999) Defect and Microstructure Analysis by Diffraction , pp. 94-126
    • Balzar, D.1
  • 22
    • 33645189983 scopus 로고
    • Kato, N. (1980). Acta Cryst. A36, 763-769, 770-778.
    • (1980) Acta Cryst. , vol.A36 , pp. 763-769
    • Kato, N.1
  • 24
  • 25
  • 37
    • 0003472812 scopus 로고
    • Reading, Mass.: Addison-Wesley
    • Warren, B. E. (1969). X-ray Diffraction. Reading, Mass.: Addison-Wesley.
    • (1969) X-ray Diffraction
    • Warren, B.E.1
  • 40
    • 0001699907 scopus 로고
    • edited by T. S. Moss, Amsterdam: Elsevier
    • Zunger, A. & Marhajan, S. (1994). Handbook on Semiconductors, Vol. 3, edited by T. S. Moss, pp. 1399-1514. Amsterdam: Elsevier.
    • (1994) Handbook on Semiconductors , vol.3 , pp. 1399-1514
    • Zunger, A.1    Marhajan, S.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.