Phenomenological analysis of heterogeneous strain fields in epitaxial thin films using x-ray scattering

Journal of Physics D: Applied Physics

Volumn 38, Issue 21, 2005, Pages 3907-3920

  Boulle, A ^a   Guinebretiere R ^a   Dauger, A ^a  

^a UNIVERSITY OF LIMOGES   (France)

Author keywords

[No Author keywords available]

Indexed keywords

CORRELATION METHODS; CRYSTALLINE MATERIALS; EPITAXIAL GROWTH; FIBER BRAGG GRATINGS; FUNCTIONS; MATHEMATICAL MODELS; STRAIN; X RAY DIFFRACTION; X RAY SCATTERING;

AUTO-CORRELATION FUNCTIONS; BRAGG PEAK; STRAIN FIELDS;

THIN FILMS;

EID: 27544475646     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/38/21/012     Document Type: Article

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