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Volumn 55, Issue 3, 1997, Pages 1793-1810
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X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures
a a a a b |
Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 0000195745
PISSN: 10980121
EISSN: 1550235X
Source Type: Journal
DOI: 10.1103/PhysRevB.55.1793 Document Type: Article |
Times cited : (316)
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References (26)
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