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Volumn 55, Issue 3, 1997, Pages 1793-1810

X-ray diffraction peaks due to misfit dislocations in heteroepitaxial structures

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EID: 0000195745     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.55.1793     Document Type: Article
Times cited : (316)

References (26)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.