Amorphous and polycrystalline photoconductors for direct conversion flat panel x-ray image sensors

Sensors

Volumn 11, Issue 5, 2011, Pages 5112-5157

  Kasap, Safa ^a   Frey, Joel B ^a   Belev, George ^a   Tousignant, Olivier ^b   Mani, Habib ^b   Greenspan, Jonathan ^b   Laperriere, Luc ^b   Bubon, Oleksandr ^c   Reznik, Alla ^c,d   DeCrescenzo, Giovanni ^d   Karim, Karim S ^e   Rowlands, John A ^d,f  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

^b Anrad Corporation   (Canada)

^c LAKEHEAD UNIVERSITY   (Canada)

^d Thunder Bay Regional Research Institute   (Canada)

^e UNIVERSITY OF WATERLOO   (Canada)

^f UNIVERSITY OF TORONTO   (Canada)

Author keywords

Detector; Direct conversion; X ray image sensor; X ray photoconductor

Indexed keywords

ELECTRONICS; EQUIPMENT DESIGN; INSTRUMENTATION; REVIEW; X RAY; X RAY FILM;

ELECTRONICS; EQUIPMENT DESIGN; X-RAY INTENSIFYING SCREENS; X-RAYS;

EID: 79957594169     PISSN: 14248220     EISSN: None     Source Type: Journal    
DOI: 10.3390/s110505112     Document Type: Review

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