Thick film compound semiconductors for X-ray imaging applications

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 563, Issue 1, 2006, Pages 1-8

  Sellin, P J ^a  

^a UNIVERSITY OF SURREY   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

CADMIUM COMPOUNDS; DETECTORS; POLYCRYSTALLINE MATERIALS; THICK FILMS; X RAY ANALYSIS;

IMAGING DETECTORS; POLYCRYSTALLINE LAYERS; PROTOTYPE DETECTOR SYSTEMS; X-RAY IMAGING;

SEMICONDUCTOR MATERIALS;

EID: 33746782527     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2006.01.110     Document Type: Article

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