Resolution degradation of semiconductor detectors due to carrier trapping

Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

Volumn 546, Issue 1-2, 2005, Pages 209-212

  Kozorezov, A G ^a   Wigmore, J K ^a   Owens, A ^b   Den Hartog, R ^b   Peacock, A ^b   Al Jawhari, Hala A ^c  

^a LANCASTER UNIVERSITY   (United Kingdom)

^b EUROPEAN SPACE AGENCY   (Netherlands)

^c KING ABDULAZIZ UNIVERSITY   (Saudi Arabia)

Author keywords

Carrier dynamics; Energy resolution; Semiconductor X ray detector

Indexed keywords

CHARGE CARRIERS; ELECTRON TRAPS; ELECTRONS; ENERGY ABSORPTION; HOLE TRAPS; PHOTONS; SEMICONDUCTOR DEVICES; SYNCHROTRON RADIATION; THALLIUM COMPOUNDS; X RAYS;

CARRIER DYNAMICS; CARRIER TRAPPING; ENERGY DYNAMICS; SEMICONDUCTOR X-RAY DETECTORS;

DETECTORS;

EID: 20444505677     PISSN: 01689002     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nima.2005.03.026     Document Type: Conference Paper

References (6)

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