X-ray sensitivity of photoconductors: Application to stabilized a-Se

Journal of Physics D: Applied Physics

Volumn 33, Issue 21, 2000, Pages 2853-2865

  Kasap, S O ^a  

^a UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE CARRIERS; ELECTRODES; ELECTRON TRAPS; HOLE TRAPS; MATHEMATICAL MODELS; SELENIUM; SENSITIVITY ANALYSIS; X RAY ANALYSIS;

HECHT COLLECTION EFFICIENCY; RAMO'S THEOREM; X RAY SENSITIVITY;

PHOTOCONDUCTING MATERIALS;

EID: 0034322894     PISSN: 00223727     EISSN: None     Source Type: Journal    
DOI: 10.1088/0022-3727/33/21/326     Document Type: Article

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