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Journal of Crystal Growth

Volumn 225, Issue 2-4, 2001, Pages 118-123

Thick films of X-ray polycrystalline mercuric iodide detectors

(12) Schieber, M a,b Hermon, H c Zuck, A a Vilensky, A c Melekhov, L a Shatunovsky, R c Meerson, E c Saado, Y a,c Lukach, M a,c Pinkhasy, E c Ready, S E d Street, R A d

a HEBREW UNIVERSITY OF JERUSALEM (Israel)

b SANDIA NATIONAL LABORATORIES (United States)

c Real Time Radiography (Israel)

d PALO ALTO RESEARCH CENTER (United States)

Author keywords

A3. Physical vapor deposition processes; A3. Polycrystalline deposition; B2. Semiconducting mercury compounds

Indexed keywords

CRYSTAL MICROSTRUCTURE; MERCURY COMPOUNDS; MORPHOLOGY; OPTICAL FILMS; PHYSICAL VAPOR DEPOSITION; RADIOGRAPHY; SCANNING ELECTRON MICROSCOPY; THICK FILMS;

MERCURIC IODIDE DETECTORS;

POLYCRYSTALLINE MATERIALS;

EID: 0035333349 PISSN: 00220248 EISSN: None Source Type: Journal
DOI: 10.1016/S0022-0248(01)00832-6 Document Type: Conference Paper

Times cited : (94)

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