-
1
-
-
0029548131
-
Two dimensional amorphous silicon image sensor arrays
-
R. A. Street, X. D. Wu, R. Weisfield, S. Ready, R. Apte, M. Nguyen, and P. Nylen, "Two dimensional amorphous silicon image sensor arrays," in MRS Symp. Proc., vol. 377, 1995, pp. 757-766.
-
(1995)
MRS Symp. Proc.
, vol.377
, pp. 757-766
-
-
Street, R.A.1
Wu, X.D.2
Weisfield, R.3
Ready, S.4
Apte, R.5
Nguyen, M.6
Nylen, P.7
-
2
-
-
0028784806
-
X-ray imaging using amorphous selenium: Feasibility of a flat panel self-scanned detector for digital radiology
-
W. Zhao and J. A. Rowlands, "X-ray imaging using amorphous selenium: Feasibility of a flat panel self-scanned detector for digital radiology," Med. Phys., vol. 22, no. 10, pp. 1595-1604, 1995.
-
(1995)
Med. Phys.
, vol.22
, Issue.10
, pp. 1595-1604
-
-
Zhao, W.1
Rowlands, J.A.2
-
3
-
-
0033864254
-
Additive noise properties of active matrix flat-panel imagers
-
Aug.
-
M. Maolinbay, Y. El-Mohri, L. E. Antonuk, K.-W. Jee, S. Nassif, X. Rong, and Q. Zhao, "Additive noise properties of active matrix flat-panel imagers," Med. Phys., vol. 27, no. 8, pp. 1841-1854, Aug. 2000.
-
(2000)
Med. Phys.
, vol.27
, Issue.8
, pp. 1841-1854
-
-
Maolinbay, M.1
El-Mohri, Y.2
Antonuk, L.E.3
Jee, K.-W.4
Nassif, S.5
Rong, X.6
Zhao, Q.7
-
4
-
-
0028392939
-
CMOS active pixel image sensor
-
Mar.
-
S. K. Mendis, S. E. Kemeny, and E. R. Fossum, "CMOS active pixel image sensor," IEEE Trans. Electron Devices, vol. 41, pp. 452-453, Mar. 1994.
-
(1994)
IEEE Trans. Electron Devices
, vol.41
, pp. 452-453
-
-
Mendis, S.K.1
Kemeny, S.E.2
Fossum, E.R.3
-
5
-
-
0035475775
-
Readout circuit in active pixel sensors in amorphous silicon technology
-
Oct.
-
K. S. Karim and A. Nathan, "Readout circuit in active pixel sensors in amorphous silicon technology," IEEE Electron Device Lett., vol. 22, pp. 469-471, Oct. 2001.
-
(2001)
IEEE Electron Device Lett.
, vol.22
, pp. 469-471
-
-
Karim, K.S.1
Nathan, A.2
-
6
-
-
0003393450
-
Modeling of static and dynamic characteristics of a-Si:H TFT's
-
M.A.Sc. thesis, Univ. Waterloo, Waterloo, ON, Canada
-
P. Servati, "Modeling of static and dynamic characteristics of a-Si:H TFT's," M.A.Sc. thesis, Univ. Waterloo, Waterloo, ON, Canada, 2000.
-
(2000)
-
-
Servati, P.1
-
7
-
-
0035018292
-
VHDL-AMS modeling and simulation of a passive pixel sensor in a-Si:H technology for medical imaging
-
Sydney, Australia, May 6-9
-
K. S. Karim, P. Servati, N. Mohan, A. Nathan, and J. A. Rowlands, "VHDL-AMS modeling and simulation of a passive pixel sensor in a-Si:H technology for medical imaging," in Proc. IEEE Int. Symp. Circuits and Systems 2001, vol. 5, Sydney, Australia, May 6-9, 2001, pp. 479-482.
-
(2001)
Proc. IEEE Int. Symp. Circuits and Systems 2001
, vol.5
, pp. 479-482
-
-
Karim, K.S.1
Servati, P.2
Mohan, N.3
Nathan, A.4
Rowlands, J.A.5
-
8
-
-
0025449034
-
A novel amplified image sensor with a-Si:H photoconductor and MOS transistors
-
June
-
Z. Huang and T. Ando, "A novel amplified image sensor with a-Si:H photoconductor and MOS transistors," IEEE Trans. Electron Devices, vol. 37, pp. 1432-1438, June 1990.
-
(1990)
IEEE Trans. Electron Devices
, vol.37
, pp. 1432-1438
-
-
Huang, Z.1
Ando, T.2
-
9
-
-
0035111662
-
Analysis of temporal noise in CMOS photodiode active pixel sensor
-
Jan.
-
H. Tian, B. Fowler, and A. El Gamal, "Analysis of temporal noise in CMOS photodiode active pixel sensor," IEEE J. Solid-State Circuits, vol. 36, pp. 92-101, Jan. 2001.
-
(2001)
IEEE J. Solid-State Circuits
, vol.36
, pp. 92-101
-
-
Tian, H.1
Fowler, B.2
El Gamal, A.3
-
10
-
-
0036565411
-
Active pixel sensor architectures in a-Si:H for medical imaging
-
May
-
K. S. Karim, A. Nathan, and J. A. Rowlands, "Active pixel sensor architectures in a-Si:H for medical imaging," J. Vac. Sci. Technol. A, vol. 20, no. 3, pp. 1095-1099, May 2002.
-
(2002)
J. Vac. Sci. Technol. A
, vol.20
, Issue.3
, pp. 1095-1099
-
-
Karim, K.S.1
Nathan, A.2
Rowlands, J.A.3
-
11
-
-
0020102486
-
1/f noise
-
M. S. Keshner, "1/f noise," Proc. IEEE, vol. 70, pp. 212-218, 1982.
-
(1982)
Proc. IEEE
, vol.70
, pp. 212-218
-
-
Keshner, M.S.1
-
12
-
-
0001000954
-
1/f noise investigations in long channel length amorphous silicon thin-film transistors
-
J. Rhayem, D. Rigaud, M. Valenza, N. Szydlo, and H. Lebrun, "1/f noise investigations in long channel length amorphous silicon thin-film transistors," J. Appl. Phys., vol. 87, no. 4, pp. 1983-1089, 2000.
-
(2000)
J. Appl. Phys.
, vol.87
, Issue.4
, pp. 1983-1989
-
-
Rhayem, J.1
Rigaud, D.2
Valenza, M.3
Szydlo, N.4
Lebrun, H.5
-
13
-
-
0001369370
-
Current-noise-power spectra of amorphous silicon thin-film transistors
-
J. M. Boudry and L. E. Antonuk, "Current-noise-power spectra of amorphous silicon thin-film transistors," J. Appl. Phys., vol. 76, pp. 2529-2534, 1994.
-
(1994)
J. Appl. Phys.
, vol.76
, pp. 2529-2534
-
-
Boudry, J.M.1
Antonuk, L.E.2
-
14
-
-
29744450559
-
Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light levels
-
May
-
Y. Degerli, F. Lavernhe, P. Magnan, and J. A. Farre, "Analysis and reduction of signal readout circuitry temporal noise in CMOS image sensors for low-light levels," IEEE Trans. Electron Devices, vol. 47, pp. 949-962, May 2000.
-
(2000)
IEEE Trans. Electron Devices
, vol.47
, pp. 949-962
-
-
Degerli, Y.1
Lavernhe, F.2
Magnan, P.3
Farre, J.A.4
-
16
-
-
0032224758
-
Large area, low-noise amorphous silicon imaging system
-
R. B. Apte, R. A. Street, S. E. Ready, D. A. Jared, A. M. Moore, R. L. Weisfield, T. A. Rodericks, and T. A. Granberg, "Large area, low-noise amorphous silicon imaging system," Proc. SPIE, vol. 3301, pp. 2-8, 1998.
-
(1998)
Proc. SPIE
, vol.3301
, pp. 2-8
-
-
Apte, R.B.1
Street, R.A.2
Ready, S.E.3
Jared, D.A.4
Moore, A.M.5
Weisfield, R.L.6
Rodericks, T.A.7
Granberg, T.A.8
-
17
-
-
33750510351
-
Integration issues for polymeric dielectrics in large area electronics
-
R. Jayakumar, K. S. Karim, S. Sivoththaman, and A. Nathan, "Integration issues for polymeric dielectrics in large area electronics," in Proc. 23rd Int. Conf. Microelectronics (MIEL 2002), May 2002, pp. 543-546.
-
Proc. 23rd Int. Conf. Microelectronics (MIEL 2002), May 2002
, pp. 543-546
-
-
Jayakumar, R.1
Karim, K.S.2
Sivoththaman, S.3
Nathan, A.4
-
18
-
-
84889392170
-
Feasibility of current mediated amorphous silicon active pixel sensor readout circuits for large area diagnostic medical imaging
-
May
-
K. S. Karim, A. Nathan, and J. A. Rowlands, "Feasibility of current mediated amorphous silicon active pixel sensor readout circuits for large area diagnostic medical imaging," in Proc. Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics and Imaging, vol. TD01, May 2002, pp. 358-360.
-
(2002)
Proc. Opto-Canada: SPIE Regional Meeting on Optoelectronics, Photonics and Imaging
, vol.TD01
, pp. 358-360
-
-
Karim, K.S.1
Nathan, A.2
Rowlands, J.A.3
-
19
-
-
34248326216
-
Resolution of amorphous silicon thin-film transistor instability mechanisms using ambipolar transistors
-
C. van Berkel and M. J. Powell, "Resolution of amorphous silicon thin-film transistor instability mechanisms using ambipolar transistors," Appl. Phys. Lett., vol. 51, no. 14, pp. 1094-1096, 1987.
-
(1987)
Appl. Phys. Lett.
, vol.51
, Issue.14
, pp. 1094-1096
-
-
Van Berkel, C.1
Powell, M.J.2
-
20
-
-
0032154561
-
Electrical instability of hydrogenated amorphous silicon thin-film transistors for active-matrix liquid-crystal displays
-
C. Chiang, J. Kanicki, and K. Takechi, "Electrical instability of hydrogenated amorphous silicon thin-film transistors for active-matrix liquid-crystal displays," Jpn. J. Appl. Phys., vol. 37(1), no. 9A, pp. 4704-4710, 1998.
-
(1998)
Jpn. J. Appl. Phys.
, vol.37
, Issue.1-9 A
, pp. 4704-4710
-
-
Chiang, C.1
Kanicki, J.2
Takechi, K.3
-
21
-
-
0034215744
-
The instability mechanisms of hydrogenated amorphous silicon thin film transistors under AC bias stress
-
C. Huang, T. Teng, J. Tsai, and H. Cheng, "The instability mechanisms of hydrogenated amorphous silicon thin film transistors under AC Bias stress," Jpn. J. Appl. Phys., vol. 39(1), no. 7A, pp. 3867-3871, 2000.
-
(2000)
Jpn. J. Appl. Phys.
, vol.39
, Issue.1-7 A
, pp. 3867-3871
-
-
Huang, C.1
Teng, T.2
Tsai, J.3
Cheng, H.4
-
22
-
-
0034845523
-
Stability issues in digital circuits in amorphous silicon technology
-
Toronto, ON, Canada, May 13-16
-
N. Mohan, K. S. Karim, and A. Nathan, "Stability issues in digital circuits in amorphous silicon technology," in Proc. IEEE Canadian Conf. Electrical and Computer Engineering 2001, vol. 1, Toronto, ON, Canada, May 13-16, 2001, pp. 583-588.
-
(2001)
Proc. IEEE Canadian Conf. Electrical and Computer Engineering 2001
, vol.1
, pp. 583-588
-
-
Mohan, N.1
Karim, K.S.2
Nathan, A.3
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