Electrical and optical characterization of ZnO based nano and large area Schottky contacts

Current Applied Physics

Volumn 11, Issue 4, 2011, Pages 959-964

  Periasamy, C ^a   Chakrabarti, P ^a  

^a BANARAS HINDU UNIVERSITY   (India)

Author keywords

Atomic force microscopy; Optoelectronics properties; Schottky contacts; Surface morphology; X ray diffraction; ZnO thin film

Indexed keywords

CONTACT ELECTRODES; GLASS SUBSTRATES; METAL SEMICONDUCTOR METAL; NANOCRYSTALLINE ZNO; NEEDLE SHAPE; OPTICAL CHARACTERIZATION; OPTOELECTRONICS PROPERTIES; PHOTORESPONSIVITY; SCHOTTKY CONTACTS; SINGLE-CRYSTALLINE; THERMAL EVAPORATION TECHNIQUE; UV DETECTOR; UV MEASUREMENTS; UV SOURCES; ZNO; ZNO NANONEEDLES; ZNO THIN FILM;

ATOMIC FORCE MICROSCOPY; DETECTORS; DIFFRACTION; METALLIC FILMS; OPTICAL FILMS; PALLADIUM; SUBSTRATES; SURFACE ROUGHNESS; THERMAL EVAPORATION; THIN FILMS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS; ZINC OXIDE;

OPTICAL PROPERTIES;

EID: 79957574868     PISSN: 15671739     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.cap.2010.10.007     Document Type: Article

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