Investigation of hexagonal microtube ZnO on silicon by capacitance-voltage measurements

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 24, Issue 2, 2006, Pages 246-249

  Sun, Yongsheng ^a   Liu, Nuo ^a   Zhou, Xi ^a   Deng, Hong ^a   Gao, Hui ^a   Wu, Haijun ^a   Li, Yanrong ^a  

^a UNIVERSITY OF ELECTRONIC SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CARRIER CONCENTRATION; ELECTRIC POTENTIAL; ELECTRIC VARIABLES MEASUREMENT; SILICON; SINGLE CRYSTALS; TUBES (COMPONENTS);

CAPACITANCE-VOLTAGE MEASUREMENTS; HEXAGONAL MICROTUBES; HYDROTHERMAL METHOD; TUBULAR STRUCTURE;

ZINC OXIDE;

EID: 33644599896     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.2165663     Document Type: Article

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