Using time-of-flight secondary ion mass spectrometry to study biomarkers

Annual Review of Earth and Planetary Sciences

Volumn 39, Issue , 2011, Pages 125-156

  Thiel, Volker ^a   Sjövall, Peter ^b  

^a UNIVERSITY OF GÖTTINGEN   (Germany)

^b SP TECHNICAL RESEARCH INSTITUTE OF SWEDEN   (Sweden)

Author keywords

biosignatures; geobiology; geomicrobiology; hydrocarbons; lipids; ToF SIMS

Indexed keywords

BIOSIGNATURES; CHEMICAL STRUCTURE; CURRENT LIMITATION; FURTHER DEVELOPMENT; GEOBIOLOGY; GEOMICROBIOLOGY; MICROSCOPIC LEVELS; MINERAL PRECIPITATE; ORGANIC GEOCHEMISTRY; TIME OF FLIGHT SECONDARY ION MASS SPECTROMETRY; TOF SIMS;

ANALYTICAL GEOCHEMISTRY; BIOMARKERS; HYDROCARBONS; LIPIDS; MICROBIOLOGY; SECONDARY EMISSION; SPECTROMETRY;

SECONDARY ION MASS SPECTROMETRY;

BIOGEOCHEMISTRY; BIOMARKER; HYDROCARBON; ION; LIPID; MASS SPECTROMETRY; MOLECULAR ANALYSIS; RESEARCH WORK; SPATIAL DISTRIBUTION;

EID: 79955518202     PISSN: 00846597     EISSN: None     Source Type: Book Series    
DOI: 10.1146/annurev-earth-040610-133525     Document Type: Article

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